Low-Temperature Moisture Transfer Characteristics Of Wheat In Thin-Layers

Dw Sun,Jl Woods
DOI: https://doi.org/10.13031/2013.28284
1994-01-01
Transactions of the ASAE
Abstract:Wheat was dried in thin layers in the temperature range 3.5 to 23.4 degrees C, with additional points at 30.4, 40.2, and 49.7 degrees C for comparison with previous work. Each sample was dried for about one week. The exponential Newton model was fitted to the data and the resulting drying constant fitted to the Arrhenius equation to describe the temperature effect. The solution for diffusion in a sphere was also fitted giving the diffusivity, which was again fitted to the Arrhenius equation. The diffusion model [standard error = 0.0031 db. (dry basis)] fitted the data better than the Newton model (standard error 0.0067 db.). The fitted dynamic equilibrium moisture content was compared with previous static equilibrium moisture content data and was generally higher, as would be expected for a dynamic value. The results are particularly relevant to moisture transfer during the cooling of stored grain, which provides a useful alternative to pesticide use.
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