Near-Infrared Spectroscopy For Non-Destructive Coating Analysis Calibrated By Terahertz Pulsed Imaging

shuncong zhong,yaochun shen,hao shen,m j evans,robert k may,j axel zeitler,ian warr
DOI: https://doi.org/10.1109/ICIMW.2010.5612668
2010-01-01
Abstract:Near-infrared (NIR) spectroscopy is a versatile technique for non-destructive analysis of pharmaceutical tablet coating thickness; however, it needs a calibration model and thus the prior knowledge about the coating thickness of each tablet is required. In this work, we demonstrate that Terahertz Pulsed Imaging (TPI) can provide, in a nondestructive fashion, such coating thickness information for building the calibration model needed by the NIR technique.
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