Neural Network-Based Non-Destructive Quantification Of Thin Coating By Terahertz Pulsed Imaging In The Frequency Domain

shuncong zhong,yaochun shen,m j evans,robert k may,j axel zeitler,dipankar dey
DOI: https://doi.org/10.1109/ICIMW.2010.5612560
2010-01-01
Abstract:Terahertz pulsed imaging (TPI) is a powerful tool for non-destructive quantification of pharmaceutical tablet coatings. In this paper, we present a Neural Network (NN) based method for extracting the coating thickness from the FFT-amplitude of the measured terahertz waveform. We demonstrate that the NN-based frequency domain method outperforms the standard "peak-finding" time-domain method, in terms of quantifying thinner coating thickness, although a learning set of data is necessary.
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