Research on Industrial Control Devices Flaw Discovery Technology

Xi Chen,Qi Li
DOI: https://doi.org/10.2991/ameii-15.2015.247
2015-01-01
Abstract:Industrial Control System (in short, ICS) is an important part of state fundamental infrastructure whose safety concerns national economy development and people’s property and life safety. Flaw discovery is the key of ICS defense. If attackers find flaws in ICS and use them for attack, the consequence will be unimaginable. The thesis focuses on researches about industrial control terminals flaw discovery and put forward a new flaw discovery method for industrial control terminals. We collect samples for test, basing on which we then make them produce variations. At last, we send those samples to target devices through dimmers to detect device flaws. The method uses cross-hardware and software programming data as test sample and applies genetic algorithms to design and achieve variogram, making the attack samples more comprehensive and effective.
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