Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor
Damiano Fasani,Luca Barbieri,Andrea Villa,Daniele Palladini,Roberto Malgesini,Giovanni D’Avanzo,Giacomo Buccella,Paolo Gadia,Giovanni D'Avanzo
DOI: https://doi.org/10.3390/s24051359
IF: 3.9
2024-02-20
Sensors
Abstract:Composite insulators for high-voltage overhead lines have better performances and are lighter than traditional designs, especially in heavily polluted areas. However, since it is a relatively recent technology, reliable methods to perform live-line diagnostics are still under development, especially with regard to internal defects, which provide few external symptoms. Thermal cameras can be employed, but their use is not always straightforward as the sun radiation can hide the thermal footprint of internal degenerative effects. In this work, an optical E-field sensor has been used to diagnose the internal defects of a set of composite insulators (bandwidth 200 mHz–50 MHz, min. detectable E-field 100 V/m). Moreover, a modelling activity using finite elements has been carried out to identify the possible nature of the defects by comparing experimental E-field profiles with those simulated assuming a specific defect geometry. The results show that the sensor can detect the presence of an internal defect, since its presence distorts the E-field profile when compared to the profile of a sound insulator. Moreover, the measured E-field profiles are compatible with the corresponding simulated ones when a conductive defect is considered. However, it was observed that a defect whose conductivity is not at least two orders of magnitude greater than the conductivity of the surroundings remains undetected.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation