Separation of Surface Roughness Profile from Raw Contour Based on Empirical Mode Decomposition

Shoubin Liu,Hui Zhang
DOI: https://doi.org/10.2991/ameii-15.2015.77
2015-01-01
Abstract:Engineering surfaces are comprised of different wavelength bands commonly referred to as roughness, waviness and form. The Gaussian filter is a common technique to separate surface roughness profile but it has some drawbacks. This paper presents an approach of utilizing Empirical Mode Decomposition (EMD) to separate surface roughness profile from raw contour. The EMD describes a time-signal with a series of Intrinsic Mode Functions (IMFs) and the residue. The residue and IMFs of frequency less than 10 within an evaluation length, are used for reconstructing EMD reference line. To achieve more accurate mean line, an Amplitude Weighting Factor (AWF) mu is applied to the IMF whose frequency is maximum among the selected IMFs. The EMD reference line is thus modified as EMD mean line. Surface roughness profile can be further separated and roughness parameters can be calculated. The comparison of EMD method and Gaussian filter is also presented.
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