Surface Roughness Separation Technology Based on Double-Density Wavelet Transform

李海燕,刘国栋,刘炳国,浦昭邦
DOI: https://doi.org/10.3969/j.issn.1006-7043.2009.04.011
2009-01-01
Abstract:With the development of micro/nano-metrology,accuracy in separating signals indicating roughness from machined surfaces has become more and more important.The wavelet mean line obtained using existing methods is dependant on the starting location of the sample.This paper presents a novel roughness separation method based on a double density wavelet transform(DDWT) for engineering surface analysis.This method overcomes the influence of sampling location on separation results and improves accuracy of roughness signal separation,waviness and other frequency components.Simulations and tests showed that the novel DDWT mean line can provide near shift-invariant extraction of surface roughness and accuracy is better by about 4% than with other methods.
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