In‐Situ Scanning Probe Microscopies: Imaging and Beyond

Bing-Wei Mao
DOI: https://doi.org/10.1002/9781118694404.ch9
2014-01-01
Abstract:This chapter focuses on in-situ scanning tunneling microscopy (STM) and atomic force microscopy (AFM). It introduces the recent advances of in-situ scanning probe microscopies (SPM) in surface electrochemistry and nanoelectrochemistry with applications that include surface characterization, nanostructuring, and molecular electronics. First, a brief discussion of the principles and features of STM and AFM is provided, and this is followed by some selected examples of the capabilities of both techniques in the study of surface and nanoelectrochemistry. AFM force measurement is also an important means for investigating the electric double layers of electrode–ionic liquid interfaces. One successful application of STM beyond imaging has been the scanning tunneling microscopy break-junction (STM-BJ) technique and modification thereof which are becoming very popular experimental platforms for nanoelectronics and molecular electronics. Finally, the prospects for the further development of in-situ SPM are reviewed.
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