Investigation of Ultrasonic Scattering Matrix Extraction of A Surface Defect Using Ultrasonic Arrays

Peng Yu,Jie Zhang,Tie Gang,Bruce Drinkwater

DOI: https://doi.org/10.1063/1.4914705

2015-01-01

Abstract:Ultrasonic arrays have been widely used and developed for defect detection and characterization over the last 10 years. In this paper we address the question of how to inspect and characterize near-surface defects that are small with respect to the wavelength. The challenge is to overcome the poor signal to noise (due to low scattered amplitude from small defects) and the proximity of these scattered signals to high amplitude signals reflected from structural features, such as planar surfaces. The combination of these effects makes identifying and characterizing such defects directly from ultrasonic images difficult. Here, a method is proposed to extract the small scattered signals from a near-surface defect within the full matrix capture data. The extracted signals were then used to generate a scattering matrix, from which it is possible to characterize the defect. In the proposed method, the location of the defect was first approximately identified from an image. The arrival time difference between the signals from the defect and the surface for each combination of transmitter and receiver array elements was then calculated. Some scattered signals can be directly separated in time from the structural features, and the others were extracted by subtracting the data with reference signals, obtained in the absence of a defect. Finally, the proposed method was used to experimentally detect and characterize three different near-surface defects and improved measurements were achieved.