Stress-Induced Self-Biasing of Magnetoelectric Coupling in Embedded Ni/Pzt/Feni Composite

W. Q. Jing,F. Fang
DOI: https://doi.org/10.1063/1.4921743
IF: 4
2015-01-01
Applied Physics Letters
Abstract:In this study, a self-biased magnetoelectric (ME) composite is designed without employing the epoxy and magnetization-graded materials. The composite is referred to as the three-phases-embedded one, consisting of a PZT ring with an inner disc of Ni50Fe50 and an outer ring of Ni via hard contact (Ni/PZT/FeNi composite). A large self-biased ME response and apparent hysteresis behavior are observed in the composites. Stress analysis and finite element simulation are carried out to reveal the underlying mechanism of the self-biased ME coupling and the magnetic-elastic-electric coupling of the embedded composites. The results indicate that the assembly stress induces magnetization of Ni at zero bias, and renders the self-biased ME coupling effect for the embedded Ni/PZT/FeNi composite.
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