Abstract:Recent technical advances in scanning transmission electron microscopy (STEM) and xray detector technology have made it possible to perform atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy (EDS) [1]. This ability allows for establishing a direct correlation between atomic-scale STEM images, such as high-angle annular dark-field (HAADF) images, and atomic-scale chemical EDS images, making chemical quantification of interfaces, defects and crystalline structure at the atomic-scale possible. Using these capabilities, we have lately quantified the chemical composition of an epitaxial (La0.7Sr0.3)MnO3 (LSMO)/BiFeO3 (BFO) quantum structure [2], cation occupancy in a Sm-doped SrTiO3 (STO) thin film and antiphase boundaries present within STO films [3], as well as determined structures of several intermetallic alloys [4]. In this study, we describe further use of these capabilities to quantify atomic-scale interdiffusion in self-assembled, vertically aligned nanocomposite (VAN) thin films. Self-assembled VAN thin films, consisting of two immiscible components heteroepitaxially grown on single crystals, have experienced an increase in research activity in recent years [5]. These structures offer the advantage of utilizing the functionalities of both components with the possibility of tuning the material’s properties by tailoring the volume ratio of the two components, the interface-to-volume ratio and hetero-epitaxial strain. In addition, modification of interface properties such as structural and elemental distribution across the interface offers an additional dimension to generate new properties and functionalities. The atomic-scale characterization of the interface plays an essential role in understanding the structure-property relationships. Here we describe the characterization of NiO:LSMO and ZnO:LSMO VAN thin

High-Sensitivity Strain Mapping Around Epitaxial Oxide Nanostructures Using Scanning X-Ray Nanodiffraction

Nanoscale mapping of surface strain in tapered nanorods using confocal photoluminescence spectroscopy

Nanoscale mapping of the full strain tensor, rotation and composition in partially relaxed In$_x$Ga$_{1-x}$N layers by scanning X-ray diffraction microscopy

Complete Strain Mapping of Nanosheets of Transition Metal Chalcogenides

Routes to Probe Strain in "zno/zns Superlattice" Nanostructures by X-Ray Diffraction

Quantitative Nanoscale Local Strain Profiling in Embedded Sige Metal-Oxide-Semiconductor Structures

Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide.

Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊044) and tilt of suspended monolithic silicon nanowire structures

HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

The Origin of Local Strain in Highly Epitaxial Oxide Thin Films

Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films

Spatial mapping of focused surface acoustic waves in the investigation of high frequency strain induced changes

Quantitative Strain Analysis and Growth Mode of Pulsed Laser Deposited Epitaxial CoFe2O4 Thin Films

Strain engineering of epitaxial oxide heterostructures beyond substrate limitations

Complete Strain Mapping of Nanosheets of Tantalum Disulfide

Non-destructive detection of cross-sectional strain and defect structure in an individual Ag five-fold twinned nanowire by 3D electron diffraction mapping

X-ray Nano-imaging of Defects in Thin Film Catalysts via Cluster Analysis

Electronic Surface Reconstruction of TiO2 Nanocrystals Revealed by Resonant Inelastic X-Ray Scattering

High-density, highly sensitive sensor array of spiky carbon nanospheres for strain field mapping

Angle-resolved optically detected magnetic resonance as a tool for strain determination in nanostructures

3D sub-nanoscale imaging of unit cell doubling due to octahedral tilting and cation modulation in strained perovskite thin films