Electrical Properties of K0.5na0.5nbo3 Thin Films Grown on Nb:Srtio3 Single-Crystalline Substrates with Different Crystallographic Orientations

Qi Yu,Jing-Feng Li,Wei Sun,Zhen Zhou,Ying Xu,Zhen-Kun Xie,Feng-Ping Lai,Qing-Ming Wang
DOI: https://doi.org/10.1063/1.4773542
IF: 2.877
2013-01-01
Journal of Applied Physics
Abstract:To attain a deep understanding of ferroelectric and piezoelectric characteristics of K0.5Na0.5NbO3 as a promising lead-free compound, the ferroelectric and piezoelectric responses of its epitaxially grown films with three primary orientations of [001], [110], and [111] were investigated with an emphasis on the influence of crystallographic orientation. The films were prepared by sol-gel processing using Nb-doped SrTiO3 single-crystalline substrates with various cutting directions. A peak remnant polarization value (Pr) of 17.3 μC/cm2 was obtained along the [110] direction due to the coincidence between the spontaneous polarization and the film orientation, which is significantly higher than 10.5 μC/cm2 in [111]-oriented and 10.1 μC/cm2 in [001]-oriented ones. However, a better piezoelectric response was achieved in the [001]-oriented films with an average local effective piezoelectric coefficient (d33) of 50.5 pm/V, as compared with 45.1 pm/V and 39.7 pm/V in [110]- and [111]-oriented films, respectively.
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