Determination Of Crystallographic Orientation Of Lead-Free Piezoelectric (K,Na)Nbo3 Epitaxial Thin Films Grown On Srtio3 (100) Surfaces

Qi Yu,Fangyuan Zhu,Liqian Cheng,Ke Wang,Jing Li
DOI: https://doi.org/10.1063/1.4868431
IF: 4
2014-01-01
Applied Physics Letters
Abstract:Crystallographic structure of sol-gel-processed lead-free (K, Na)NbO3 (KNN) epitaxial films on [100]-cut SrTiO3 single-crystalline substrates was investigated for a deeper understanding of its piezoelectric response. Lattice parameter measurement by high-resolution X-ray diffraction and transmission electron microscopy revealed that the orthorhombic KNN films on SrTiO3 (100) surfaces are [010] oriented (b-axis-oriented) rather than commonly identified c-axis orientation. Based on the crystallographic orientation and corresponding ferroelectric domain structure investigated by piezoresponse force microscopy, the superior piezoelectric property along b-axis of epitaxial KNN films than other orientations can be explained. (C) 2014 AIP Publishing LLC.
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