Modeling Of Fatigue Behavior In Relaxor Piezocrystals: Improved Characteristics By Mn Substitution

shashank priya,hyeoung woo kim,jungho ryu,shujun zhang,thomas r shrout,kenji uchino
DOI: https://doi.org/10.1063/1.1503411
IF: 2.877
2002-01-01
Journal of Applied Physics
Abstract:The functional form of the time decay of the remanent polarization under high-electrical drives, known as fatigue, has been derived for relaxor piezoelectric materials based on the hierarchical relaxation process, typical of disordered systems such as random-field and glassy states and is given in terms of normalized remanent polarization ((P) over bar (r)) as (P) over bar (r)(t)=(P) over bar (o)t(-x) exp[-c(t/tau)(beta)]. This function was verified by fitting the dynamics of the fatigue behavior in 0.92Pb(Zn1/3Nb2/3)O-3-0.08 PbTiO3 (PZN-PT) relaxor-based piezoelectric system. Mn modification of a PZN-PT single crystal improved the fatigue behavior by slowing down the relaxation processes and pinning the domain wall motion. (C) 2002 American Institute of Physics.
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