The Position Shifting of Frequency Spectrum of Fourier Transform in the Application of Aspheric Surface Testing
Junmiao Weng,Yongying Yang,Dong Liu,Yibing Shen,Yongmo Zhuo
DOI: https://doi.org/10.1117/12.760148
2008-01-01
Abstract:In the measurement of aspheric surfaces, spatial phase modulation technology is always combined. With a tilt, the linear spatial carrier is introduced to enhance the signal noise ratio (SNR). Then using DFT on the interferogram, after spectrum shifting, the first order spectrum filter and IDFT, the wavefront phase of aspheric surface is obtained. In this paper, the traditional way to introduce spatial carrier, namely that the center of the first order spectrum is positioned on the x axis, is analyzed. This method exist a limitation which may influence the testing result. Thus a new method is put forward here. Make sure the slope of spatial carrier is unvaried, and transfer the first order spectrum to the bisector of x axis and y axis. This change can not only reserve the low frequency components of the first order spectrum, but also keep the high frequency components at a large extent. So in some circumstance, the wavefront phase of aspheric surface with a large PV value can't be recovered accurately by the traditional spatial carrier way, but it can be recovered accurately by the new way. This greatly expands the testing range of wavefront of aspheric surface.