Highly Reliable Dc SQUIDs in Temperature with Laser-Mbe YBa2Cu3OX Thin Films
J Wang,B Han,F Chen,T Zhao,FZ Xu,YL Zhou,GH Chen,HB Lu,QS Yang,TH Cui
DOI: https://doi.org/10.1016/s0038-1098(03)00213-8
IF: 1.934
2003-01-01
Solid State Communications
Abstract:Highly reliable dc superconducting quantum interference devices (SQUIDs) in temperature with step edge junctions (SEJs) were fabricated with laser molecular beam epitaxy (L-MBE) YBa2Cu3OX thin films. The reflection high-energy electron diffraction oscillation cycles proved that the superconducting films were epitaxially grown on the atomic scale. In the dc SQUID temperature transition curves, the tail structures appear at a temperature close to the transition point. The critical current dependent temperature, IC∼(1−T/TC)2, shows that the L-MBE SEJ behaves like an SNS type junction. The white noise level, 2.0×10−5Φ0/Hz at 200Hz, triangular wave signal, critical current and other characteristics exhibit no change after 42 temperature cycles and 108 days of storage.