Evaluation of the Thermal Interface Crack Problem in Packaging Structure

Fengnan Guo,Jianwei Cui,Yuanhe Wang,Yu Liu,Licheng Guo
DOI: https://doi.org/10.2991/icmra-15.2015.35
2015-01-01
Abstract:In this paper, the interaction integral method is developed to study the thermal fracture mechanics of packaging structures. The present interaction integral can be proved to be domain-independent for the packaging structures with complex interfaces. The mixed-mode thermal stress intensity factors (TSIFs) of the packaging structure can be obtained using the present method. The domain-independence of the present method is verified. The thermal fracture problems of flip-chip packaging with complex interfaces are investigated.
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