Abstract:The dispersive linear optical properties of materials are frequently described using oscillator models, where the oscillators represent interactions between light and various material resonances (vibrational, free-carrier, interband, etc.). The state-of-the-art measurement of the complex refractive index is variable-angle spectroscopic ellipsometry (VASE), where additional measurement angles and the measured depolarization of light provides much more information compared to simpler measurements such as single-angle reflectance and transmittance. Nevertheless, even state-of-the-art VASE data can be hard to uniquely fit using oscillator models, and the resulting models may be hard to interpret physically. Here, we demonstrate the use of an additional degree of freedom, temperature, to improve the accuracy, uniqueness, and physicality of oscillator models of materials. Our approach relies on the well-understood temperature dependence of material resonances, and in particular vibrational resonances in amorphous SiO2, which are expected to change monotonically from room temperature to hundreds of degrees C. We performed VASE measurements at different temperatures, independently fitted the data at each temperature, and then confirmed that our models are unique and physical by monitoring the temperature dependence of the resulting fitting parameters. Using this technique, we generated highly accurate and precise data sets and material models describing the mid-infrared complex refractive index of three different grades of fused SiO2, which can then be used for modeling of mid-infrared optical components such as thermal emitters.

Temperature-dependent Infrared Dielectric Functions of MgO Crystal: an Ellipsometry and First-Principles Molecular Dynamics Study.

Temperature-dependent optical properties of hexagonal and cubic Mg<sub><i>x</i></sub>Zn<sub>1 <i>x</i></sub>O thin-film alloys

Oxygen-vacancy-ordering-induced Metal-Insulator Transition in MgO Single Crystals

Origin Of Room Temperature Ferromagnetism In Mgo Films

Theoretical description of optical and x-ray absorption spectra of MgO including many-body effects

Far Infrared Reflection Spectrum and IR-active Modes of MgTiO3

Impedance and modulus spectroscopy of MgF2 single crystals

Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study

Temperature-dependent microwave dielectric permittivity of gallium oxide: A deep potential molecular dynamics study

First-principle calculation and assignment for vibrational spectra of Ba (Mg 1/2 W 1/2) O 3 microwave dielectric ceramic

Investigation of High Temperature Electrical Insulation Property of MgO Ceramic Films and the Influence of Annealing Process

Intensity and wavelength dependence of anisotropic nonlinear absorption inside MgO

Long-Wavelength Optical Phonon Properties Of Ternary Mgzno Thin Films

Investigating the mechanism of infrared emissivity control in MgO doped YSZ based ceramics

Room temperature Raman spectroscopy and 29Si MAS NMR combined with high temperature Raman spectroscopy and DFT calculation of xMgO-(1-x)CaO–SiO2 glasses and melts

Microstructure and Dielectric Properties of MgO-Al2O3-SiO2-TiO2-CeO2 System Glass-Ceramics

Microstructure and Dielectric Properties of Low Temperature Sintered MgO-based Ceramics at Millimeter Wave and Terahertz Frequencies

Temperature-dependent dielectric function of germanium in the UV-vis spectral range: A first-principles study

Infrared Permittivity of the Biaxial van der Waals Semiconductor α-MoO3 from Near- and Far-Field Correlative Studies

Effect of Temperature on Raman Scattering in Hexagonal ZnMgO for Optoelectronic Applications

Ellipsometry Analysis of Mg<sub>x</sub>Zn<sub>1-x</sub>O Films on Silicon Substrates