Near Surface Magnetic Domain Observation with Ultra-High Resolution.

Zhenghua Li,Xiang Li,Dongping Liu,H. Saito,S. Ishio
DOI: https://doi.org/10.1039/c4nr02215g
IF: 6.7
2014-01-01
Nanoscale
Abstract:Near field magnetic force microscopy (NF-MFM) has been demonstrated to locally observe the magnetic fine structures in nanosized recording bits at an operating distance of 1 nm. The nanoscale magnetic domains, the polarity of surface magnetic charges, as well as the 3D magnetic fields leaking from the bits are investigated via NF-MFM with a soft NiFe tip. A Fourier analysis of the images suggests that the magnetic moment can be determined locally in a volume as small as 5 nanometers. The NF-MFM is crucial to the analysis of surface magnetic features and allows a wide range of future applications, for example, in data storage and biomedicine.
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