Abstract:The transient electrothermal (TET) technique was developed and has been widely used for measuring the thermal diffusivity of fiber- and film-like materials at the micro/nanoscale. Upon step-current heating, the measured voltage-time (V V-t) t ) of the sample usually follows a sole increasing or decreasing trend, depending on the temperature coefficient of its electrical resistivity (BT B T = d rho e/dT, e / dT, rho e : electrical resistivity, T : temperature). Past physical mode for the V-t t profile is based on an assumption that BT T is constant during TET measurement, which applies to a large variety of materials. However, for semiconductive materials, BT T depends on the charge carrier density and scattering time, and both vary with temperature. Therefore, BT T has very strong nonlinear change with temperature, sometimes changes sign during TET measurement. This leads to abnormal V-t t profiles that have never been addressed well, thereby making TET measurement not applicable for such scenarios. In this work, a new physical model is developed to consider the strong nonlinear relation between rho e e and T to the third order. Our numerical modeling firmly proves the validity of this new model. Thin films of graphene (GreF) and single- walled carbon nanotube (SWCNTs) mat are measured using the TET technique over a wide temperature range: 84.5-690.9 K for the GreF, and 12-290 K for the SWCNT film. At a specific temperature for each sample, a semiconductive-to-metallic transition comes about and manifests in the resistance-temperature response, hence leading to abnormal TET signals. These TET signals are perfectly fitted using our nonlinear BT T T model to determine alpha . Intriguingly, the determined alpha of the GreF for the transition phase follows the overall alpha T trend, confirming the robustness of the model. The obtained alpha T trend is interpreted well using the thermal reffusivity theory and structure deterioration under temperature change. This work significantly extends the capability of TET to semiconductors for alpha measurement. Also, the new methodology developed for obtaining alpha at zero temperature rise significantly improves the measurement control and accuracy.

Characterization of Thermal Transport in One-Dimensional Solid Materials

Thermal Characterization of Microscale Conductive and Nonconductive Wires Using Transient Electrothermal Technique

Characterization of Thermal Diffusivity of Micro/nanoscale Wires by Transient Photo-Electro-thermal Technique

Thermal Diffusivity Characterization of Semiconductive 1D Micro/nanoscale Structures

Thermal Transport in Extremely Confined Metallic Nanostructures: TET Characterization

Thermal Characterization of Micro/nanoscale Conductive and Non-Conductive Wires Based on Optical Heating and Electrical Thermal Sensing

Thermophysical properties of 1D materials: transient characterization down to atomic level

Hassle-free Approach to Thermal Transport Measurements Using Spatial-Temporal Temperature Data

Non-contact measurement of thermal diffusivity in tissue

Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials

A Noncontact Method for Measuring Thermal Conductivity and Thermal Diffusivity of Anisotropic Materials

Advanced Approaches for Quantitative Characterization of Thermal Transport Properties in Soft Materials Using Thin, Conformable Resistive Sensors

Simultaneous measurements of the specific heat and thermal conductivity of suspended thin samples by transient electrothermal method.

Thermal Characterization of Single-Wall Carbon Nanotube Bundles Using the Self-Heating 3ω Technique

Nonlinear Effects In Transient Electrothermal Characterization Of Anatase Tio2 Nanowires

Short Hot Wire Technique for Measuring Thermal Conductivity and Thermal Diffusivity of Various Materials

Simultaneous thermal conductivity and specific heat measurements of thin samples by transient Joule self-heating

Non-contact methods for thermal properties measurement

Characterization of thermal conductivity, diffusivity, specific heat, and interface thermal resistance of carbon nanostructures

Thermal Characterization of Micro/Nanoscale Wires/Tubes Using Pulsed Laser-assisted Thermal Relaxation

Analysis of radiation effect on thermal conductivity measurement of semi-transparent materials based on transient plane source method