Abstract:Total internal reflection (TIR) optical spectroscopies have been widely used for decades as non-destructive and surface-sensitive measurements of thin films and interfaces. Under TIR conditions, an evanescent wave propagates into the sample layer within a region approximately 50 nm to 2 μm from the interface, which limits the spatial extent of the optical signal. The most common TIR optical spectroscopies are fluorescence (i.e., TIRF) and infrared spectroscopy (i.e., attenuated total reflection infrared). Despite the first report of TIR Raman spectroscopy appearing in 1973, this method has not received the same attention to date. While TIR Raman methods can provide chemical specific information, it has been outshined in many respects by surface-enhanced Raman spectroscopy (SERS). TIR Raman spectroscopy, however, is garnering more interest for analyzing the chemical and physical properties of thin polymer films, self-assembled monolayers (SAMs), multilayered systems, and adsorption at an interface. Herein, we discuss the early experimental and computational work that laid the foundation for recent developments in the use of TIR Raman techniques. Recent applications of TIR Raman spectroscopy as well as modern TIR Raman instruments capable of measuring monolayer-sensitive vibrational modes on smooth metallic surfaces are also discussed. The use of TIR Raman spectroscopy has been on a rise and will continue to push the limits for chemical specific interfacial and thin film measurements. Graphical abstract Total internal reflection (TIR) Raman spectroscopy can extract the chemical and physical information from thin films and adsorbates.

Total Internal Reflection with Fluorescence Correlation Spectroscopy: Applications to Substrate-Supported Planar Membranes.

Total Internal Reflection Fluorescence Pattern-Illuminated Fourier Ptychographic Microscopy

Sub-Diffraction Imaging with Total Internal Reflection Fluoresence (tirf) Microscopy by Stochastic Photobleaching

Particle localization with total internal reflection illumination and differential detection

Note: An easy way to enable total internal reflection-fluorescence correlation spectroscopy (TIR-FCS) by combining commercial devices for FCS and TIR microscopy

Quantitative Objective-Based Ring TIRFM System Calibration Through Back Focal Plane Imaging.

3-D Reconstruction of Cortical Microtubules Using Multi-Angle Total Internal Reflection Fluorescence Microscopy

The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces

Total internal reflection microscopy: a powerful tool for exploring interactions and dynamics near interfaces

An atomic force microscopy and total internal reflection fluorescence microscopy correlated system (AFM–TIRF) for fluorescence imaging and spectroscopy of a single particle

Single-molecule Fluorescence Imaging of Membrane-Bound Proteins for Studies of Cell Signal Transduction

Near-Membrane Refractometry Using Supercritical Angle Fluorescence

Ligand-receptor kinetics measured by total internal reflection with fluorescence correlation spectroscopy

VISUALIZING Ca2+ SPARKS AND SUBSTRUCTURE OF Ca2+ WAVES BY TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY (TIRFM)

Visualizing Substructure of Ca2+waves by Total Internal Reflection Fluorescence Microscopy

Visualizing substructure of Ca<sup>2+</sup>waves by total internal reflection fluorescence microscopy

Elliptical mirror-based TIRF microscopy with shadowless illumination and adjustable penetration depth.

Correlative single-molecule and structured illumination microscopy of fast dynamics at the plasma membrane

Resonant multi-dielectric coverslip for enhanced total internal reflection fluorescence microscopy

A Comprehensive Review of Fluorescence Correlation Spectroscopy

Scanning Fluorescence Correlation Spectroscopy (SFCS) with a Scan Path Perpendicular to the Membrane Plane