Capturing Transient Structures in the Elimination Reaction of Haloalkane in Solution by Transient X-ray Diffraction.

Jae Hyuk Lee,Tae Kyu Kim,Joonghan Kim,Qingyu Kong,Marco Cammarata,Maciej Lorenc,Michael Wulff,Hyotcherl Ihee
DOI: https://doi.org/10.1021/ja710267u
IF: 15
2008-01-01
Journal of the American Chemical Society
Abstract:This Communication reports simultaneous tracking of structural and kinetic information for the photoinduced elimination reaction of 1,2-diiodotetrafluoroethane in solution by transient X-ray diffraction. The transient structure of .CF2CF2I is determined to be a classical mixture whereas .CH2CH2I is bridged. Compared with the gas phase reaction, the secondary dissociation of .CF2CF2I into C2F4 and I is slowed down by a factor of 6 in solution. Transient X-ray diffraction offers a complementary method for capturing transient structures in solution which might be invisible or "optically silent" in time-resolved optical spectroscopy.
What problem does this paper attempt to address?