X-ray Emission from 424-Mev/u C Ions Impacting on Selected Target
Xian-Ming Zhou,Rui Cheng,Yu Lei,Yuan-Bo Sun,Yu-Yu Wang,Xing Wang,Ge Xu,Ce-Xiang Mei,Xiao-An Zhang,Xi-Meng Chen,Guo-Qing Xiao,Yong-Tao Zhao
DOI: https://doi.org/10.1088/1674-1056/25/2/023402
2016-01-01
Abstract:The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C6+ ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of K beta/K alpha is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation (BEA), plane wave approximation (PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic (ECPSSR) theoretical predictions. The BEA model with considering the multipleionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented.