Multielectron Processes in Collisions of Xe23+ Ions with Ar Atoms

B. W. Ding,D. Y. Yu,C. J. Shao,R. C. Lu,F. F. Ruan,H. C. Li,W. J. Zhang,X. H. Cai
DOI: https://doi.org/10.1140/epjd/e2011-20511-7
2011-01-01
The European Physical Journal D
Abstract:We report the measurements of relative cross sections for multielectron processes incollisions of Xe23+ ions with argon atoms in the velocity range of0.65–1.32 a.u. By means of the coincidence time-of-flight (TOF) technique, the finalcharge states of both the projectile and target ions for each collision event aredetermined. The present experimental data are compared with the scaling law by Selberget al. [Phys. Rev. A 54, 4127 (1996)] and the extended classical over-barrier(ECB) model.
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