Abstract:We present a new comprehensive mathematical model of the cone-shaped cantilever tip-sample interaction in Atomic Force Microscopy (AFM). The importance of such AFMs with cone-shaped cantilevers can be appreciated when its ability to provide high-resolution information at the nanoscale is recalled. It is an indispensable tool in a wide range of scientific and industrial fields. The interaction of the cone-shaped cantilever tip with the surface of the specimen (sample) is modeled by the damped Euler-Bernoulli beam equation $ \rho_A(x)u_{tt} $ $ +\mu(x)u_{t}+(r(x)u_{xx}+\kappa(x)u_{xxt})_{xx} = 0 $, $ (x, t)\in (0, \ell)\times (0, T) $, subject to the following initial, $ u(x, 0) = 0 $, $ u_t(x, 0) = 0 $ and boundary, $ u(0, t) = 0 $, $ u_{x}(0, t) = 0 $, $ \left (r(x)u_{xx}(x, t)+\kappa(x)u_{xxt} \right)_{x = \ell} = M(t) $, $ \left (-(r(x)u_{xx}+\kappa(x)u_{xxt})_x\right)_{x = \ell} = g(t) $ conditions, where $ M(t): = 2h\cos \theta\, g(t)/\pi $ is the moment generated by the transverse shear force $ g(t) $. Based on this model, we propose an inversion algorithm for the reconstruction of an unknown shear force in the AFM cantilever. The measured displacement $ \nu(t): = u(\ell, t) $ is used as additional data for the reconstruction of the shear force $ g(t) $. The least square functional $ J(F) = \frac{1}{2}\Vert u(\ell, \cdot)-\nu \Vert_{L^2(0, T)}^2 $ is introduced and an explicit gradient formula for the Fréchet derivative of the cost functional is derived via the weak solution of the adjoint problem. Additionally, the geometric parameters of the cone-shaped tip are explicitly contained in this formula. This enables us to construct a gradient based numerical algorithm for the reconstructions of the shear force from noise free as well as from random noisy measured output $ \nu (t) $. Computational experiments show that the proposed algorithm is very fast and robust. This creates the basis for developing a numerical "gadget" for computational experiments with generic AFMs.

Generating Images from Non-Raster Data in AFM

Local raster scanning for high-speed imaging of biopolymers in atomic force microscopy.

Experimental Verification of High Speed AFM Through Local Raster Scanning

Demonstration of High Speed Afm Through Local Raster Scanning

Optimal Sampling and Reconstruction of Undersampled Atomic Force Microscope Images Using Compressive Sensing.

Fast Scanning in AFM Using Non-Raster Sampling and Time-Optimal Trajectories

Fast AFM Imaging Based on Compressive Sensing Using Undersampled Raster Scan

Note: Fast Imaging Of Dna In Atomic Force Microscopy Enabled By A Local Raster Scan Algorithm

Reconstruction of Undersampled Atomic Force Microscope Images Using Block-Based Compressive Sensing

A Stitching Method for AFM Based Large Scale Scanning with High Resolution

High Speed Atomic Force Microscopy Enabled By A Sample Profile Estimator

A Novel Atomic Force Microscope with High Stability and Scan Speed

Three-dimensional visualization of large-area, nanoscale topography measurements

On Detection and Estimation in Atomic Force Microscopy at Different Scan Speeds

Automated Force Volume Image Processing for Biological Samples

A near real-time framework for extracting tip-sample forces in dynamic atomic force microscopy (dAFM)

Noninvasive Subcellular Imaging Using Atomic Force Acoustic Microscopy (Afam)

Speeding up the Topography Imaging of Atomic Force Microscopy by Convolutional Neural Network.

Automated Real-Space Lattice Extraction for Atomic Force Microscopy Images

Adaptive under-sampling strategy for fast imaging in compressive sensing-based atomic force microscopy

Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip