Size-dependent Characteristics of Highly-Scalable In2Se3 Nanowire Phase-Change Random Access Memory

Bo Jin,Jungsik Kim,Daegun Kang,M. Meyyappan,Jeong-Soo Lee
DOI: https://doi.org/10.1109/nano.2013.6721030
2013-01-01
Abstract:Electrical phase transition characteristics of self-assembled In2Se3 nanowire-based phasechange random access memory are presented. Through repeatable phase switching behavior in In2Se3 nanowire, we explored critical device parameters, such as set/reset programming voltage, extremely high resistance ratio (similar to 10(7)), power consumption, thermal resistance by Fourier's law, resistance drift coefficient by power law, etc. Size-dependent properties were observed: a systematic reduction in set/reset voltage and programming power, increase in thermal resistance of amorphous/crystalline phases and decrease in resistance drift coefficient at reset state, all scaling down the nanowire diameter. Such investigations provide an opportunity to develop highlyscalable and thermally efficient nonvolatile memory architecture in the future.
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