Abstract:Surface breakdown of dielectric window seriously limits the transmission of high power microwave (HPM), which blocks the development of microwave technology. Under X-band HPM with the power level of 1 GW at 9.4 GHz, dielectric breakdown experiments were conducted with several dielectric window materials including polytetrafluoroethylene (PTFE), low-density polyethylene (LDPE), high-density polyethylene (HDPE) and polymethyl methacrylate (PMMA) in vacuum. The influence of different surface treatments for PTFE with notching and polishing on its breakdown characteristics is also studied. After breakdown, the photographs of damaged dielectric samples are analyzed with macroscopic and microcosmic observations. There are obvious tree-like breakdown phenomena occurred on the upstream face of the dielectric window along the direction of microwave electric field. The damage is significantly affected by the different surface treatments. It is considered that the treelike breakdown channels are closely related to the applied microwave field. Based on in-depth observation on the tree failure inside the transparent PMMA sample, it was found that, the tree developed along the surface and also inside of the material. A physical model is proposed to describe the dielectric window breakdown under HPM. It is suggested that the electric field results in the tree developing along the material surface. Possible reason for the tree invading into the material is analyzed. Moreover, several kinds of possible manners are presented to describe the tree initiation and development inside the dielectric window.

Multipactor simulation of grooved dielectric window surface

Rectangular Grooves Suppressing Multipactor Across High Power Microwave Dielectric Window

Investigation of grooved surface suppressing multipactor across HPM dielectric window

Self-consistent Simulation of Radio Frequency Multipactor on Micro-Grooved Dielectric Surface

Improving the Threshold of Multipactor Using a Graded Permittivity Dielectric Window

Investigation on Dielectric Window Treelike Breakdown and Suppression under HPM in Vacuum

Simulation study of secondary electron multiplication on microwave dielectric window

Review of Recent Theories and Experiments for Improving High-Power Microwave Window Breakdown Thresholds

Two Dimensional Particle-in-cell Simulation of Electron Multipactor on High Power Microwave Dielectric Window Surface

Damage phenomena of dielectric window material under X-band high power microwave

Experimental study of dielectric window breakdown suppression technology under HPM in vacuum

Pic-Mcc Simulation for Hpm Multipactor Discharge on Dielectric Surface in Vacuum

Numerical Simulations of High Power Microwave Dielectric Interface Breakdown Involving Outgassing

Investigation on Multipactor in Double-Sided Dielectric-Loaded Microwave Components

Effects of an External Magnetic Field on Multipactor on a Dielectric Surface

Tree-like Breakdown Phenomena of Dielectric Window under X-band High Power Microwave in Vacuum

Suppression of High-Power Microwave Window Breakdown by the Sweeping-out-electron Effect with an External Dc Bias Electric Field

Numerical Simulation of Multipactor on Dielectric Surface in High Direct Current Field

Simulation of multipactor on the rectangular grooved dielectric surface

Resonant dynamics of one-side multipactor on dielectric surface

Experimental Verification of Improving High-Power Microwave Window Breakdown Thresholds by Resonant Magnetic Field