Characterization and Modeling of the Substrate Noise and Its Impact on the Phase Noise of Vco

HL Liao,SC Rustagi,JL Shi,YZ Xiong
DOI: https://doi.org/10.1109/rfic.2003.1213936
2003-01-01
Abstract:This paper presents a simple scheme for estimating the digital switching noise at the sensitive RF nodes with the help of a lumped element model for the substrate network. The model parameters have been extracted from the 2-port RF measurements. The efficacy of different isolation schemes such as grounded P+ guard bars and deep N-well has been investigated using phase noise of a VCO as a figure of merit.
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