Array Failure Diagnosis Using Sparse Excitation Source Reconstruction: Reliability Against Position of Near Field Observations

Y. Zhang,H. Zhao,E. -P. Li
DOI: https://doi.org/10.1109/ieee-iws.2014.6864185
2014-01-01
Abstract:Sparse excitation source reconstruction is a recently developed method for array failure diagnosis. The method reconstructs the excitation source of all elements utilizing the sparsity of the excitation vector, which improves the accuracy of the source reconstruction. Meanwhile, the sparse excitation source reconstruction provides straightforward information on the failing elements. However, same as other diagnosis methods, the diagnosis reliability of sparse excitation source reconstruction depends on the position of near field observations. In order to facilitate the positioning of near field observations, this work presents numerical study on the diagnosis reliability against the position of near field observations. Based on numerical experiments, guidelines on positioning near field observations are presented.
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