A new op-amp noise model for switched-capacitor sigma-delta modulator in SIMULINK

feng wu,z j chen,min zhao,d y xu,g c shen,w g lu,y c zhang
DOI: https://doi.org/10.1109/EDSSC.2014.7061122
2014-01-01
Abstract:Precise behavioral models are needed to simulate switched-capacitor sigma-delta modulators more efficiently. This paper presents a new noise model of the operational amplifier (op-amp) used in a typical correlated double sampling (CDS) integrator. Evaluation and validation of the new model are done via behavioral and transistor-level simulations for a 2-1 MASH modulator using SIMULINK and SPECTRE with 0.35um CMOS technology. Two sets of results for comparison are obtained and the biggest difference between the two simulators is around 2dB.
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