Abstract:This paper addresses the problem of automatic quality inspection in assembly processes by discussing the design of a computer vision system realized by means of a heterogeneous multiprocessor system-on-chip. Such an approach was applied to a real catalytic converter assembly process, to detect planar, translational, and rotational shifts of the flanges welded on the central body. The manufacturing line imposed tight time and room constraints. The image processing method and the features extraction algorithm, based on a specific geometrical model, are described and validated. The algorithm was developed to be highly modular, thus suitable to be implemented by adopting a hardware-software co-design strategy. The most timing consuming computational steps were identified and then implemented by dedicated hardware accelerators. The entire system was implemented on a Xilinx Zynq heterogeneous system-on-chip by using a hardware-software (HW-SW) co-design approach. The system is able to detect planar and rotational shifts of welded flanges, with respect to the ideal positions, with a maximum error lower than one millimeter and one sexagesimal degree, respectively. Remarkably, the proposed HW-SW approach achieves a 23× speed-up compared to the pure software solution running on the Zynq embedded processing system. Therefore, it allows an in-line automatic quality inspection to be performed without affecting the production time of the existing manufacturing process.

A high speed vision processor for chip package visual inspection

A high-speed vision processor based on pixel-parallel PE array and its applications

A high speed multi-level-parallel array processor for vision chips

7.3 A 1000fps Vision Chip Based on a Dynamically Reconfigurable Hybrid Architecture Comprising a PE Array and Self-Organizing Map Neural Network

A 1000 Fps Vision Chip Based on a Dynamically Reconfigurable Hybrid Architecture Comprising a PE Array Processor and Self-Organizing Map Neural Network.

Simd Massively Parallel Processing System For Real-Time Image Processing

Ultrahigh Framerate Vision Chip Featuring Central-Based Edge Detection Processed by All-Digital In-Imager Global-Parallel Processing Architecture

A Massively Parallel Keypoint Detection and Description (MP-KDD) Algorithm for High-Speed Vision Chip

Design and Performance of a 1 ms High-Speed Vision Chip with 3D-Stacked 140 GOPS Column-Parallel PEs †

A Compact PE Memory for Vision Chips

Dynamic Detection Technology of Picture Processor and Memory

Optoelectronic Morphological Processor for Industrial On-Line Inspection

Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement

Design of Visual Inspection System Based on DSP and USB Interface

Robust and High-Performance Machine Vision System for Automatic Quality Inspection in Assembly Processes

A Machine Vision System For Film Capacitor Defect Inspection

Automated visual inspection of surface mounted chip components

A 4k×2k@60fps Multi-format Multi-function Display Processor for High Perceptual Quality

A Heterogeneous Architecture for the Vision Processing Unit with a Hybrid Deep Neural Network Accelerator

Implementation of Parallel Acceleration for Real-time Extraction of Visual Features.

A 4K $\times$ 2k@60fps Multifunctional Video Display Processor for High Perceptual Image Quality