Abstract:Scan chain design facilitates chip testing by providing an interface for the test engineers to access and control the internal states of the circuit. This feature has also been exploited to break systems such as the cryptographic chips by the attack known as scan chain side channel analysis. From the perspective of information access, test engineers and scan chain attackers have the same goal - observe and control the scan chain side channel information. Consequently, all the existing countermeasures have to make the tradeoff between scan chain security and the testability it can provide. In this paper, we propose a novel public-private partial scan chain design which can deliver both full testability and security. The key idea is to partition the flip flops into a public partial chain and a set of parallel private partial chains. The private partial chains are protected by means of a hardware implemented finite state machine and an obfuscation mechanism based on configurable physical unclonable function. We demonstrate how full testability can be achieved by the proposed public-private partial chains. We conduct security and performance analysis to show that our approach is robust against all the known scan chain based attacks and can improve testing time and power consumption with negligible hardware overhead.

A Novel Structure of Dynamic Configurable Scan Chain Bypassing Unconcerned Segments on the Fly

A Secure Scan Method for Crypto Chips

A scan chain optimization method for diagnosis

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

A novel configurable boundary-scan circuit design of SRAM-based FPGA

Asynchronous reconfigurable computing array design

Balancing Testability and Security by Configurable Partial Scan Design.

Partial Scan Design Against Scan-Based Side Channel Attacks.

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Improving test effectiveness of scan-based BIST by scan chain partitioning

A Scan Segmentation Architecture for Power Controllability and Reduction

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

Design and Realization of Boundary-scan Test Circuit for FPGA's Chip

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

A low power architecture based on unidirectional cut

An Obfuscation Scheme of Scan Chain to Protect the Cryptographic Chips.

A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning