Inelastic X-Ray Scattering Study on the Single Excitations of Helium

L. F. Zhu,L. S. Wang,B. P. Xie,K. Yang,N. Hiraoka,Y. Q. Cai,D. L. Feng

DOI: https://doi.org/10.1088/0953-4075/44/2/025203

2011-01-01

Abstract:The inelastic x-ray scattering technique has been used to study the excitation mechanism of atomic helium in this work. The squares of the form factor for the single excitations of 1s2 → 1snl (n ⩽ 6) of helium have been determined by the high resolution (70 meV) inelastic x-ray scattering. The present squares of the form factor measured by inelastic x-ray scattering provide an independent cross-check to the ones measured by high-energy electron energy loss spectroscopy. It is found that the squares of the form factor for the single excitations of 1s2 → 1snl (n ⩽ 6) of helium measured by inelastic x-ray scattering are in excellent agreement with the ones measured by high-energy electron energy loss spectroscopy, which confirms the quality of these two experimental methods. The excellent agreement of the present measurements with the theoretical calculations also gives a rigorous test of the theoretical method. This work demonstrates that inelastic x-ray scattering is a powerful tool to study the excitation mechanism in atomic or molecular systems at the third-generation synchrotron radiation light source.