Force Mode Dip-Pen Nanolithography on Soft Polydimethylsiloxane Surface

Haijun Yang,Guangxia Shen,Shouwu Guo
DOI: https://doi.org/10.1063/1.3597158
IF: 4
2011-01-01
Applied Physics Letters
Abstract:Control on the loading force supplied on atomic force microscopy tip and the tip dwell time on substrate are important for dip-pen nanolithography (DPN), especially operating on soft substrate. A force mode DPN (FMDPN) method has been developed in this letter. Using FMDPN, the loading force can be properly tuned by presetting a “trigger threshold” parameter, and the dwell time can be adjusted by changing the “surface delay” data. Thus, the DPN can be conducted more controllably, and the nanopatterns could be prepared on soft substrate easily.
What problem does this paper attempt to address?