Sub-100 nm, Centimeter-Scale, Parallel Dip-Pen Nanolithography

Khalid Salaita,Seung Woo Lee,Xuefang Wang,Ling Huang,Timothy M. Dellinger,Chang Liu,Chad A. Mirkin
DOI: https://doi.org/10.1002/smll.200500202
IF: 13.3
2005-01-01
Small
Abstract:Atomic force microscope (AFM) cantilever linear arrays are used for parallel dip-pen nanolithography (DPN). Three different tip configurations are studied, all of which involve only a single feedback system in a conventional AFM instrument or an Nscriptor, a dedicated instrument designed for DPN. A simple and convenient tip–substrate alignment procedure provides centimeter-scale, sub-100 nm resolution patterning (see micrograph image). Supporting information for this article is available on the WWW under http://www.wiley-vch.de/contents/jc_2421/2005/z500202_s.pdf or from the author. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
What problem does this paper attempt to address?