The Correlation Between Electric Field Emission Phenomenon and Schottky Contact Reverse Bias Characteristics in Nanostructured Systems

J. Yu,J. Liu,M. Breedon,M. Shafiei,H. Wen,Y. X. Li,W. Wlodarski,G. Zhang,K. Kalantar-zadeh
DOI: https://doi.org/10.1063/1.3583658
IF: 2.877
2011-01-01
Journal of Applied Physics
Abstract:Two different morphologies of nanotextured molybdenum oxide were deposited by thermal evaporation. By measuring their field emission (FE) properties, an enhancement factor was extracted. Subsequently, these films were coated with a thin layer of Pt to form Schottky contacts. The current-voltage (I-V) characteristics showed low magnitude reverse breakdown voltages, which we attributed to the localized electric field enhancement. An enhancement factor was obtained from the I-V curves. We will show that the enhancement factor extracted from the I-V curves is in good agreement with the enhancement factor extracted from the FE measurements.
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