Fault Diagnosis with Bayes of Sequential Discrete Event Mechatronic Systems Based on Petri Net

蔡露,许黎明,柴运东,郝圣桥
DOI: https://doi.org/10.16183/j.cnki.jsjtu.2011.11.013
2011-01-01
Abstract:This paper presented a novel method for fault diagnosis of a proposed sequential discrete event mechatronic(SDEM) system based on Petri net.A timed series connection of sequential discrete event Petri net was defined to model the SDEM system.Time measurement of transition was considered as a statistic.A Bayes based test certification method was put forward and applied in the significant test of variance difference.The prior knowledge was well combined with the real time monitoring information based on the proposed method.It was used in fault diagnosis of an automatic material transfer system and the results illustrate the validity and the feasibility of the method.
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