Study on fault diagnosis of electronic system using Bayesian network

XU Li-jia,WANG Hou-jun,LONG Bing
DOI: https://doi.org/10.3778/j.issn.1002-8331.2009.08.059
2009-01-01
Abstract:Electronic systems often own complex structures,and their sub-modules are interactional and anfractuous.Furthermore number of testing nodes is usually less and the testing data are incomplete.Aiming at these circumstances,the paper presents a new fault diagnosis approach based on Bayesian network for an electronic power.Firstly based on the original structure of elec-tronic power,authors gain cause-result graph and discretize all testing signals;then a Bayesian network is built for fault diagnosis and its parameters are studied through historical data;finally the Bayesian network is applied to diagnose true fault by using the actual data.Simulation experiments verify the effectiveness of the proposed approach,which provides a new way for fault diagnosis of electronic systems.
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