On-Line Defect Detecting Method Based on Kernel Method

Xu Kejia,Chen Bin,Zeng Li
DOI: https://doi.org/10.4028/www.scientific.net/kem.474-476.858
2011-01-01
Key Engineering Materials
Abstract:The conflict between accuracy and speed is one of the most well-known dilemmas of the real-time defect detecting system. This paper presents a real-time defect detecting algorithm based on Kernel principal component analysis (KPCA). KPCA-based feature extraction have recently shown to be very effective for image denoising, however the Normal KPCA method is time-consuming. In our method, we propose a progressive algorithm to speed up the reconstruct process while improve accuracy. Experimental results demonstrate that our method is dramatically better than Normal KPCA Pre-image method in terms of speed and performance.
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