Reliability Evaluation of an Implantable Deep Brain Stimulator

Weiming Wang,Bozhi Ma,Hongwei Hao,Luming Li
DOI: https://doi.org/10.1109/icrms.2011.5979240
2011-01-01
Abstract:The long-term reliability of an implantable deep brain stimulator is very important. In this paper, the long-term reliability of an implantable deep brain stimulator was evaluated through a series of stress and accelerated life tests on the devices and PCB of the stimulator. The PCB circuit was subjected to temperature shock, vibration test, temperature cycling, burn-in, and accelerated life test. The devices were subjected to temperature shock, temperature cycling and burn-ins. All the samples of deep brain stimulators passed the whole tests. Results of this study confirmed the reliability of the deep brain stimulator has been used in the clinical trial.
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