Electrochemical Characterization of Metal Oxynitride Thin Film As New Lithium Storage Materials

Yong-Ning Zhou,Zheng-Wen Fu
DOI: https://doi.org/10.4028/www.scientific.net/amr.295-297.912
2011-01-01
Advanced Materials Research
Abstract:Metal oxynitride (VxON, CrxON) thin film has been fabricated by reactive dc sputtering method and annealing process. Its electrochemical properties are investigated in a MxON/Li cell. The reversible specific capacities are around 830 mAh g(-1) for VxON and 730 mAh g(-1) for CrxON. By using selected-area electron diffraction and X-ray photoelectron spectroscopy measurements, New electrochemical reaction mechanism is uncovered, which should be responsible for its good electrochemical performance.
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