Modeling Accelerated Degradation Data Based on the Uncertain Process
Xiaoyang Li,Ji-Peng Wu,Le Liu,Meilin Wen,Rui Kang
DOI: https://doi.org/10.1109/tfuzz.2018.2883016
IF: 12.253
2018-01-01
IEEE Transactions on Fuzzy Systems
Abstract:Accelerated degradation testing (ADT) aids the reliability and lifetime evaluations for highly reliable products. In engineering applications, the number of test items are generally small due to finance or testing resources constraints, which leads to the rare knowledge to evaluate reliability and lifetime. Consequently, the epistemic uncertainty is embedded in ADT data and the large-sample based probability theory is not appropriate any more. To solve this problem, in this paper, we introduce the uncertainty theory, which is a theory different from the probability theory, to account for such uncertainty due to small samples and build up a framework of ADT modeling. In this framework, an uncertain accelerated degradation model (UADM) is firstly proposed based on the arithmetic Liu process. Then, the uncertain statistics for parameter estimations is presented correspondingly, which is completely constructed on objectively observed ADT data. An application case and a simulation case are used to illustrate the proposed methodology. With further comparisons with the Wiener process based accelerated degradation model (WADM) and the Bayesian-WADM (B-WADM), the sensitivities of these models to sample sizes are explored, and the results show that the proposed methodology is superior to the other two probability-based models under the small sample size.