Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution

Xianbing Wang,Ningbo Zhang,Tiancun Hu,Qian Sun,Wanzhao Cui,Ming Ye,Yongning He,Sun, Q.F.
DOI: https://doi.org/10.1109/APEMC.2010.5475733
2010-01-01
Abstract:In this paper, the Weibull distribution is employed to characterise the surface topography in the analysis of the passive intermodulation (PIM) between rough circular waveguide flanges, where the PIM level as a function of different system parameters such as the applied pressure, roughness, layer thickness and the power ratio has been developed assuming that the PIM level for a particular set of parameters is known. The proposed method is more significant when the contact surface needs to be described by parameters like the skewness or the kurtosis.
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