Ultra-high temperature ablation image acquisition and analysis system based on CCD

Zhiwen Wang,Xiuyan Peng
DOI: https://doi.org/10.1109/ICINFA.2010.5512442
2010-01-01
Abstract:A system, which can capture the real time image of ablative surface under strong stray light environments caused by plasma arc, has been presented. The system has been under nearly one year of service in some national key laboratory. It has been shown that the system can effectively shield the influence of plasma jet and stray light with the temperature over 4,000 K and in the meanwhile, high quality image (with the resolution of 0.01 mm) of ablative surface (with the temperature of 3,000 K) can be obtained. The image acquisition system provided in the present paper can not only be applied to plasma jet on-line monitoring, but also be used in other areas which require real-time monitoring under strong stray light environments.
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