Abstract:Fourier transform infrared (FTIR) spectroscopy is a widely used characterization technique for studying chemical compositions and light-matter interactions in the infrared range. However, it remains challenging to use conventional FTIR equipment to characterize materials that are environmentally sensitive and/or have rough surfaces due to their dynamic response to external stimuli (e.g., humidity) and light scattering from the sample surface. Here, we describe an approach enabling quantitative infrared spectroscopy measurements of these challenging samples, including transmittance, reflectance, and emissivity. We designed and 3D-printed a miniaturized environmental chamber that can be directly inserted into the sample holder of a conventional integrating sphere to perform total transmission and reflection measurements in controlled environments. Moreover, a calibration method was developed to exclude light scattering from rough surfaces of the sample and the distortion created by infrared windows. To illustrate the potential application of this method, we have performed quantitative infrared measurements, both specular and diffusive, on a sapphire standard reference with a specular surface, as well as a textile sample that has a rough surface and is dynamically responsive to changes in humidity. The calibrated results measured with the equipped chamber match those measured without the IR windows, demonstrating the viability of our environmental chamber and the proposed calibration method. This quantitative infrared spectroscopy measurement technique may help advance fields such as metasurfaces and adaptive textiles, where samples are often rough, dynamically responsive, and/or environmentally sensitive.

Measurement System for FT-IR Infrared Spectral Emissivity of Solid Surface at Ultra-High Temperature

[The Linearity Analysis of Ultrahigh Temperature FTIR Spectral Emissivity Measurement System].

Fourier Transform Spectrometer for Spectral Emissivity Measurement in the Temperature Range Between 60 and 1500°C

Apparatus for Measuring Spectral Emissivity of Solid Materials at Elevated Temperatures

Measurement of High-Temperature Spectral Emissivity Using Integral Blackbody Approach

Measurement of Directional Spectral Emissivity at High Temperatures

An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures

Simultaneous measurement of normal spectral emissivity and temperature of materials with low thermal conductivity

Investigation of High-Temperature Normal Infrared Spectral Emissivity of ZrO2 Thermal Barrier Coating Artefacts by the Modified Integrated Blackbody Method

Quantitative Infrared Spectroscopy of Environmentally Sensitive and Rough Materials.

Field Measurement Methods for Thermal Infrared Spectral Emissivity of Terrestrial Surface Materials

Precision Measurement Facility Of Mid-Infrared Spectral Emissivity Measurement

Radiative properties characterization of ZrB2–SiC-based ultrahigh temperature ceramic at high temperature

Development of An Apparatus for the Directional Spectral Emissivity Measurement from 50 °C to 1000 °C

The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity

An in Situ Online Methodology for Emissivity Measurement Between 100 °C and 500 °C Utilizing Infrared Sensor

An Emissivity Measurement Apparatus for Near Infrared Spectrum

Temperature Measuring System in High Temperature Carbon Reducing Environment

A New Emissivity Measuring Apparatus Based on Infrared Thermal Imager

Measurement of Spectral Emissivity Based on FT-IR

Measuring Method of the Spectral Absorptivity for Solar Selective Absorption Coatings at High Temperature