A 12-Bit 100 MS/s Pipelined ADC with Digital Background Calibration

Zhou Liren,Luo Lei,Ye Fan,Xu Jun,Ren Junyan
DOI: https://doi.org/10.1088/1674-4926/30/11/115007
2009-01-01
Journal of Semiconductors
Abstract:This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter (ADC) with digital background calibration.A large magnitude calibration signal is injected into the multiplying digital-to-analog converter (MDAC) while the architecture of the MDAC remains unchanged.When sampled at 100 MS/s,it takes only 2.8s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input.Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration.The chip is fabricated in a 0.18μm CMOS process,occupies an active area of 2.3×1.6 mm2,and consumes 205mW at 1.8V.
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