Analog Circuit Fault Diagnosis Based on Cross-Entropy Method and Support Vector Machine

TANG Jing-yuan,SHI Yi-bing,ZHOU Long-fu,ZHANG Wei
DOI: https://doi.org/10.3321/j.issn:1001-0920.2009.09.028
2009-01-01
Abstract:Considering that many irrelevant or redundant features in fault diagnosis system seriously spoil the fault diagnosis performance,a fault diagnosis method based on the cross-entropy method and support vector machine is proposed.Firstly,a population of random variable samples is generated by some kinds of probability distribution,and the object value of the samples is evaluated by using SVM classifiers.Parameter-updating rule of distribution parameters is established based on min-cross-entropy theory.After several iterations,the best object feature subset and optimized parameters are selected out.Then the CEM-SVM model of the circuit fault diagnosis system is built by training the SVM with optimized features and parameters.Finally,analog circuit fault diagnosis experiment on leapfrog filter shows the effectiveness of feature selection and parameters optimization of the proposed method which improve the fault classification rate and the speed fault diagnosis time.
What problem does this paper attempt to address?