Hypergeometric Distribution Method for Testability Estimation and Demonstration

马彦恒,韩九强,李刚
DOI: https://doi.org/10.3321/j.issn:0253-987x.2009.03.009
2009-01-01
Abstract:The problems in present demonstration method of fault detection rate(RFD) and fault isolation rate(RFI) are analyzed,and the fault detection coverage percentage(RFDC) and fault isolation coverage percentage(RFIC) are taken as the testability estimation indexes instead of RFD and RFI.Therefore,a new hypergeometric distribution method is proposed for testability estimation and demonstration.Based on hypergeometric distribution,the maximum likelihood estimate method is applied in point estimation,and the Bayes formula is applied for interval estimation,hence a testability demonstration rule is provided.Simulation results show that the hypergeometric distribution method is more accurate than the conventional binomial distribution method for testability estimation and demonstration under certain samples.The proposed method is suitable for the estimation and demonstration of current electronic devices.
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