Characteristics of pure and Fe doped polycrystalline CeO 2 using terahertz spectroscopy

Qi-Ye Wen,Huai-Wu Zhang,Qing-Hui Yang,Sheng Li,Jie Zha,De-Gang Xu,Jian-Quan Yao
DOI: https://doi.org/10.1117/12.820520
2008-01-01
Abstract:Ferromagnetic high-k dielectrics are very promising candidates to replace SiO 2 in silicon based microelectronics industry, and also could simultaneously enable semiconductor spintronic devices that harness polarized electrons. In present work, Fe doped CeO 2 was synthesized by ceramic method and the effects of Fe doping on the structure and properties were characterized by ordinary methods and terahertz-time domain spectrometer (THz-TDS) technique. Our results show that the pure CeO 2 only has a small dielectric constant (e) of 4, while a small amount of Fe (0.9%) doping into CeO 2 promotes the densification and induces a large e of 23. From the THz spectroscopy, it is found that for undoped CeO 2 both the power absorption and the index of refraction increase with frequency, while for Fe doped CeO 2 we measure a remarkable transparency together with a flat index curve. The absorption coefficient of Fe doped CeO 2 was less than 0.35 cm -1 ranging from 0.2 to 1.8 THz, rendering it a potential THz optical material. Our results also illustrate that THz technique is a powerful tool to differentiate the dielectric related electronic characteristics of high k materials.
What problem does this paper attempt to address?