Temperature-Dependent Photoluminescence from ZnO/Zn0.85Mg0.15O Heterostructure Grown on Si(111) Substrates

L. P. Zhu,X. Q. Gu,H. P. He,F. Huang,M. X. Qlu,Z. Z. Ye,Y. Z. Zhang,B. H. Zhao
DOI: https://doi.org/10.3938/jkps.53.2985
2008-01-01
Journal of the Korean Physical Society
Abstract:A ZnO/Zn0.85Mg0.15O single quantum well (SQW) was fabricated on a Si(111) substrate by using a pulsed laser deposition (PLD) technique. Photoluminescence (PL) measurements were carried out in the range of 10 - 290 K in order to investigate the mechanism of carrier dynamics. At 10 K, the sample exhibited two predominant ultraviolet emissions, one at 3.57 eV and the other at 3.38 eV, which were attributed to recombinations of localized excitons (LE band) in the barrier and the well layers, respectively. The quantum well emission showed a blue shift of nearly 20 meV with respect to the epitaxial ZnO films. We also observed that the carrier localization resulted in an "S-shaped" red-blue-red shift of the similar to 3.38 eV emission with increasing temperature.
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